Bruker的Contour Elite™3D光学显微镜采用Contougg设计®platform’s industry-leading metrology and Vision64®analysis software, which is capable of high-fidelity imaging.
Contour Elite™提供精密,高速运行和可重复性,这些功能是顶级研发和生产所需的功能。
此外,它还提供了共聚焦显微镜的共同益处,例如成像和显示。
Types of Contour Elite™ 3D Optical Microscopes
- Contour Elite K
- Contour Elite I
- Contour Elite X
一般特征
The general features of the Contour Elite™ 3D optical microscope range include:
- 高保真成像允许用户查看测量的内容
- 颜色和灰度成像显示以前隐藏的微观细节
- 真正的彩色成像,颜色分割和计量无缝集成
- 高保真成像增强了测量数据
- 用于明智的研发决策的定量,可重复的表面数据
- 最佳可用的组合横向和垂直分辨率的任何3D光学显微镜
- Quicker solutions to intricate research and production challenges
- 快速,非破坏性成像,最快的数据时间
- Highly advanced, production-ready automation
- 简单直观的操作,可实现优异易用
- User-friendly interface for simplified characterization and analysis
- Flexible staging and fixturing to suit specific applications
具体特征
Contour Elite™3D光学显微镜范围的具体功能包括:
高保真成像增强的可靠测量数据
若干行业涉及具有关键性能要求的产品的制造,在这里,这些产品在每一次时都会精确。
For instance, in the medical sector, products such as medical implants, such as intraocular lenses, heart stents and hip or knee replacement joints. In the automotive and aerospace sectors, highest performing parts and assemblies are expected to ensure safety or successful mission.
高保真成像,看看你衡量的是什么
Communicating the results is as important as collecting precise data, therefore a high-fidelity grayscale and color imaging option with special side illumination and superior algorithms, is provided with the Contour Elite™.
Users will be able to access additional points of view which are not possible with systems catering only to metrology. Moreover, the Contour Elite™ will be able to provide recognizable surface feature details for reporting.
3D光学显微镜中的横向和垂直分辨率
轮廓精英™系统有杰出的中国ated lateral and vertical resolution beyond the industry’s largest field of view, with a vertical range of sub-nanometer to greater than 10mm.
研发100屡获殊荣的AcuityXR®测量技术是系统的一部分,在工业3D光学显微镜中提供顶级横向分辨率。它还具有打破衍射极限的能力。
Acuityxr.®可以减少由光学元件引起的模糊,并且在窄特征的情况下,它提供了量化边缘变化的改进能力,从而即使在最小的结构上也可以进行过程控制。百万像素相机增加了X-Y空间分辨率。
用于知识的研发和QA / QC决策的定量,可重复的,表面数据
Contour Elite™系统具有稳定的硬件设计和制造,以确保高振动耐受性,从而即使在嘈杂的生产环境中也提高了可靠性和测量可重复性。
卓越易用的简单直观操作
Contour Elite™具有简化的用户界面,可最大限度地提高用户效率并简化测量和分析。它也是易于使用的,并且是当今市场上最全面而全面的3D表面计量平台。
Intuitive, User-Friendly Interface for Simplified Characterization and Analysis
The Vision64 measurement setup window is provided with a simple “pull-down” menu to choose measurement type and magnification. With the aid of the instrument control window or joystick, the stage is easily positioned.
即使第一次用户在秒内收集高质量数据,即使在秒内收集质量数据也易于使用,新的简易测量选项卡的单键式向导易于使用。简单的照明控制提供了所需的照明,以清楚地查看实时视频窗口中的示例功能。
Likewise, the data analysis window offers easy access to the most common plot objects with a single click. The Contour Elite™ enables customization of plots and helps in combining plot types, creating reports and adding text and graphics.
Faster Solutions to Complex Research and Production Challenges
The Contour Elite™ 3D optical microscopes has numerous features such as highly accurate measurement capabilities, extensive user-customization features, an intuitive visual workflow, automated functions, and high-fidelity imaging so as to provide fast, highly comprehensive data collection and analysis for a wide range of research and production applications.
These optical microscopes were designed based on three decades of proprietary Wyko®white light interferometric (WLI) hardware and software technology advancement.
真正的彩色成像,颜色分割和计量无缝组合
Contour Elite™通过能够查看,识别和显示测量结果的能力实现了高级计量的集成。这与理解数据一样至关重要,并传达结果很重要。精确的计量数据和清晰的表面图像为用户提供全面的表面表征故事。
Color and Grayscale Imaging to Reveal Previously Hidden Microscopic Details
The high-fidelity imaging Contour Elite™ displays specific surface details, which is not possible to see. This feature allows users to segment data according to color or grayscale data, and to swiftly chose areas of interest and gather critical metrology data from these definite regions. It provides users the ability to really see the sample along with its 3D topography, thereby enabling better problem solving in engineered surface applications.
快速,非破坏性成像,数据最快的数据
Contour Elite™显微镜是具有大阶段的非接触式单元,以确保样品或零件保持完整并没有损坏。Bruker的专利WLI技术能够获得具有亚纳米精度的高度数据,该亚纳米精度是使用的倍率的自主。
Even when sampling over a million data points in a millimeters-squared image area, users will be able to collect high-resolution height data in just a matter of seconds. The Contour Elite’s automation scripting will allow further benefit from this rapid data acquisition.
灵活的分级和固定装置,适合您的应用
Contour Elite™显微镜提供自动化的150mm(6英寸)级或300mm(12英寸)级。在圆柱形样品的情况下,可以使用辊子级的选择,该辊子级可用于旋转部件以获得来自特定部位的表面数据或通过利用圆柱形缝合。提供可选的电动炮塔,可容纳多达五个目标,倍率为0.5倍至230倍。
最先进,生产准备自动化
可选的高级生产接口可以适用于轮廓Elite™系统,以进一步提高制造能力。这可以提供自动映射的工具,自定义过程工作流程和负载测量配方。
Fruker的轮廓Elite™3D光学显微镜系列
顶部:电子材料表面的测量结果,显示3D高度图覆盖有灰度图像。底部:用单个绘图放置在图像表面上的光标配置文件。
Live view of defocused surface of a metallic cylinder (left) with a traditional interferometry profiler. Clear through-focus image (right) measured with Contour Elite using the enhanced imaging function.
3D CU电镀的高度贴图用于半导体IC包装的再分配层(RDL)。
Measured surface of stamped metal showing 3D height map with color image overlay.
Through-focus grayscale image.