S neox Cleanroom—For Optical Metrology

The S neox Cleanroom represents a previously unheard-of technological turning point for optical metrology. It offers the most versatility within manufacturing settings.

With its four different light sources and four-in-one technology, the S neox Cleanroom offers unmatched adaptability for shifting application requirements.

S neox Cleanroom—For Optical Metrology

Image CreditSensofar Metrology

It has been meticulously designed to be ISO Class 1 and ESD compatible.

S neox Cleanroom—For Optical Metrology

Image Credit: Sensofar Metrology

Piezoelectric Z motor integration is an option for the S neox Cleanroom, improving performance. It also covers thicknesses between 50 nm and 5 mm.

S neox Cleanroom—For Optical Metrology

Image Credit: Sensofar Metrology

Focus on the sample’s surface and the integrable head will automatically determine the best acquisition setting for any measurement with this equipment when using the 3D Auto mode.

S neox Cleanroom—For Optical Metrology

Image Credit: Sensofar Metrology

客观镜头

表格1。Source: Sensofar Metrology

Brightfield Interferometry
MAG 5X 10X 20倍 50X 100X 150X 2.5倍 5X 10X 20倍 50X 100X
NA 0.15 0.30 0.45 0.80 0.90 0.95 0.075 0.13 0.30 0.40 0.55 0.70
WD (mm) 23.5 17.5 4.5 1.0 1.0 0.2 10.3 9.3 7.4 4.7 3.4 2.0
FOV1(μm) 3378x
2826
1689x
1413
845x
707
338x
283
169x
141
113x
94
6756x
5652
3378x
2826
1689x
1413
845x
707
338x
283
169x
141
Spatial sampling2(μm) 1.38 0.69 0.34 0.13 0.07 0.05 2.76 1.38 0.69 0.34 0.13 0.07
Optical resolution3(μm) 0.94 0.47 0.31 0.18 0.16 0.148 1.87 1.08 0.47 0.35 0.26 0.20
Measurement noise4(nm) 100 30 8 5 3 1 PSI/ePSI 0.1 nm (0.01 nm with PZT) CSI 1 nm
Maximum slope5(º) 9 17 27 44 64 72 4 7 17 24 33 44

System Specifications

Table 2.Source: Sensofar Metrology

. .
测量原理 Confocal, PSI, ePSI, CSI, Ai Focus Variation and Thin Film
Measurement types Image, 3D, 3D thickness, profile and coordinates
Camera 5 Mpx: 2448x2048 pixels (60 fps)
共聚焦帧速率 60 fps (5 Mpx); 180 fps (1.2 Mpx)
Vertical scan range coarse Linear stage: 40 mm range; 5 nm resolution
Vertical scan range fine Piezoelectric scanner with capacitive sensor: 200 μm range; 1.25 nm resolution
Max. Z measuring range PSI 20 μm, ePSI 10 mm, CSI 10 mm; Confocal & Ai Focus Variation 34 mm
LED light sources 红色(630 nm);绿色(530 nm);蓝色(460 nm)和白色(575 nm;中心)
Nosepiece 6 positions fully motorized
Sample reflectivity 0.05% to 100%
高级软件分析 Inc: SensoVIEW; Op: SensoPRO, SensoMAP
Communication protocol dll;XML(可选)
Computer 最新的英特尔处理器
操作系统 Microsoft Windows 10®, 64 bit
Cable Length 3 m (5 m, 10 m optional)
环境 Temperature 10 ºC to 35 ºC; Humidity <80% RH; Altitude <2000 m

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Dimensions

S neox Cleanroom—For Optical Metrology

Image Credit: Sensofar Metrology

1Maximum field of view with 3/2” camera and 0.5X optics.
2Pixel size on the surface.
3L&S: Line and Space, half of the diffraction limit according to the Rayleigh criterion. Spatial sampling could limit the optical resolution for interferometric objectives. Values for blue LED.
4Measurement noise measured as the difference between two consecutive measures on a calibration mirror placed perpendicular to the optical axis. For interferometry objectives, PSI, 10 phase averages. The 0.01 nm are achieved with Piezo stage scanner and temperature-controlled room. Values for green LED (white LED for CSI). Values obtained in a VC-E vibration environment.
5On smooth surfaces. Up to 86° on rough surfaces.
6This is the weight of the sensor head with one objective in the turret.

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